Description
Product details
Authors | Alexandr Mendes, Alexandre Mendes, Pedro Paulo Novellino do Rosario |
Publisher | Springer, Berlin |
Original title | Metrologia e Incerteza de Medição - Conceitos e Aplicações |
Languages | English |
Product format | Hardback |
Released | 22.02.2025 |
EAN | 9783031823022 |
ISBN | 978-3-0-3182302-2 |
No. of pages | 325 |
Dimensions | 155 mm x 22 mm x 235 mm |
Weight | 631 g |
Illustrations | XXIII, 325 p. 143 illus., 102 illus. in color. |
Subjects |
Natural sciences, medicine, IT, technology
> Technology
> General, dictionaries
Nanotechnologie, Quantenphysik (Quantenmechanik und Quantenfeldtheorie), Atom- und Molekularphysik, Materialwissenschaft, Angewandte Optik, Messtechnik und Kalibrierung, Traceability, Measurement Science and Instrumentation, metrology, Quantum Measurement and Metrology, measurement uncertainty, Optical Metrology, Nanometrology, industrial calibration, calibration certificate, Metrology and Fundamental Constants |
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