Advances in Imaging and Electron Physics

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

List of contents

1. Gaussian Beam Propagation in Inhomogeneous Nonlinear Media. Description in Ordinary Differential Equations by Complex Geometrical OpticsPawel Berczynski and Slawomir Marczynski
2. Single-Particle Cryo-Electron Microscopy: Progress, Challenges, and Perspectives for Further Improvement David Agard, Yifan Cheng, Robert M. Glaeser and Sriram Subramaniam
3. Morphological Amoebas and PDEsMartin Welk and Michael Breu

Product details

• Assisted by: Peter W. Hawkes (Editor), Hawkes Peter W. (Editor of the series)
• Publisher: Elsevier Science & Technology
• Languages: English
• Product format: Hardback
• Released: 30.07.2014
• EAN: 9780128001448
• ISBN: 978-0-12-800144-8
• Dimensions: 152 mm x 15 mm x 229 mm
• Weight: 570 g
• Series: Advances in Imaging and Electron Physics
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; SCIENCE / Physics / Nuclear, TECHNOLOGY & ENGINEERING / Electronics / General, Nuclear physics, Electronics engineering