Advances in Imaging and Electron Physics

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

List of contents

1. Towards Quantitative Scanning Electron MicroscopyMohamed M. El-Gomati and Christopher G.H. Walker
2. Logarithmic WaveletsLaurent Navarro, Guy Courbebaisse and Michel Jourlin
3. 3D Sparse RepresentationsFrancois Lanusse, Jean-Luc Starck, Arnaud Woiselle and M. Jalal Fadili

Product details

• Assisted by: Peter W. Hawkes (Editor), Peter W. Hawkes (Editor of the series)
• Publisher: Elsevier Science & Technology
• Languages: English
• Product format: Hardback
• Released: 16.05.2014
• EAN: 9780128002650
• ISBN: 978-0-12-800265-0
• Dimensions: 152 mm x 15 mm x 229 mm
• Weight: 480 g
• Series: Advances in Imaging and Electron Physics
• Subjects: Natural sciences, medicine, IT, technology > Natural sciences (general); SCIENCE / Physics / Electricity, SCIENCE / Physics / Magnetism, TECHNOLOGY & ENGINEERING / Electronics / General, SCIENCE / Physics / Electromagnetism, Electricity, electromagnetism & magnetism, Electronics engineering, Electricity, electromagnetism and magnetism