Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

List of contents

1. Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications2. Voltage Contrast Modes in a Scanning Electron Microscope and Their Application3. A Review of Scanning Electron Microscopy in Near Field Emission Mode

Product details

• Authors: Peter W. Hawkes, Peter W. Hawkes
• Publisher: Elsevier Science & Technology
• Languages: English
• Product format: Hardback
• Released: 26.09.2016
• EAN: 9780128048122
• ISBN: 978-0-12-804812-2
• Dimensions: 152 mm x 20 mm x 229 mm
• Weight: 679 g
• Series: Advances in Imaging and Electron Physics
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics; SCIENCE / Physics / Nuclear, TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Imaging Systems, Nuclear physics, Particle & high-energy physics, Imaging systems & technology, Electronics engineering, Particle and high-energy physics, SCIENCE / Physics / Particle, Imaging systems and technology