Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices

The book addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime.

List of contents

1. Analytical Modeling. 2. Method of Interfacial Compliance. 3. Thermal Stress in Assemblies with Identical Adherends. 4. Inelastic Strains. 5. Elevated Stand-Off Heights Can Relieve Thermal Stress in Solder Joints. 6. Stress Relief in Assemblies with Inhomogeneous Bonds. 7. Relieving Thermal Stress in Flip-Chip Design. 8. Board Level Dynamic Tests. 9. Accelerated Testing: HALT and FOAT. 10. Probabilistic Design for Reliability of Solder Joint Interconnections. 11. Thermal Stress in Optical Fibers

Summary

The book addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime.

Product details

• Authors: Ephraim Suhir
• Publisher: Taylor and Francis
• Languages: English
• Product format: Paperback / Softback
• Released: 04.10.2024
• EAN: 9780367635886
• ISBN: 978-0-367-63588-6
• No. of pages: 382
• Weight: 453 g
• Illustrations: schwarz-weiss Illustrationen, Tabellen, schwarz-weiss
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics; TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General, Electronics: circuits and components, Circuits & components