VLSI Fault Modeling and Testing Techniques

This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.

About the author

George W. Zobrist

Product details

• Authors: George W. Zobrist
• Assisted by: George W. Zobrist (Editor)
• Publisher: Bloomsbury
• Languages: English
• Product format: Hardback
• Released: 01.05.1993
• EAN: 9780893917814
• ISBN: 978-0-89391-781-4
• Subjects: Non-fiction book > Psychology, esoterics, spirituality, anthroposophy > Psychology: general, reference works; COMPUTERS / Computer Science, Psychology, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, computer science, 3D graphics & modelling, COMPUTERS / Design, Graphics & Media / Graphics Tools, Electronics: circuits and components, Circuits & components, 3D graphics and modelling