$Peter. B (Oxford University Hirsch, Peter. B (University Of Oxford Hirsch - Topics in Electron Diffraction and Microscopy of Materials$

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Peter. B (Oxford University Hirsch, Peter. B (University Of Oxford Hirsch

Topics in Electron Diffraction and Microscopy of Materials

English · Hardback

New edition in preparation, currently unavailable

Description

Summary

Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.

Product details

Assisted by	Peter. B (Oxford University Hirsch (Editor), Peter. B (University Of Oxford Hirsch (Editor)
Publisher	Taylor & Francis Ltd.

Languages	English
Product format	Hardback
Released	01.01.1999

EAN	9780750305389
ISBN	978-0-7503-0538-9
No. of pages	208
Weight	317 g
Series	Series in Microscopy in Materials Science
Subject	Natural sciences, medicine, IT, technology > Geosciences > Mineralogy, petrography

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