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This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
List of contents
Theory and applications of speckle displacement and decorrelation, I. Yamaguchi; techniques of displacement and deformation measurements in speckle metrology, Pramod K. Rastogi; speckle methods in experimental mechanics, Rajpal S. Sirohi; recent developments in video speckle interferometry, Ole J. Lokberg; novel applications of speckle metrology, Chandra S. Vikram; particle image velocimetry (PIV), K.D. Hinsch; white light speckle metrology, Anand K. Asundi; surface roughness evaluation, J.D. Briers; automatic fringe analysis procedures in speckle metrology, G.H. Kaufmann; speckle metrology using hololenses, Chandra Shahker; correlation speckle interferometry in the mechanics of contact interaction, Yu I. Ostrovsky and V.P. Shchepinov.
About the author
R. S Sirohi (Author)
Summary
Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).
