Fr. 92.00

Statistical Methods for Materials Science - The Data Science of Microstructure Characterization

English · Paperback / Softback

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Description

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Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the analysis and applications section addresses compressed sensing methods, stochastic models, extreme estimation, and approaches to pattern detection.

List of contents

1 Materials Science vs. Data Science 2 Emerging Digital Data Capabilities 3 Cultural Differences 4 Forward Modeling 5 Inverse Problems and Sensing 6 Model-Based Iterative Reconstruction for Electron Tomography 7 Statistical reconstruction and heterogeneity characterization in 3-D biological macromolecular complexes  8 Object Tracking through Image Sequences 9 Grain Boundary Characteristics 10 Interface Science and the Formation of Structure 11 Hierarchical Assembled Structures from Nanoparticles  12 Estimating Orientation Statistics 13 Representation of Stochastic Microstructures 14  Computer Vision for Microstructure Representation 15 Topological Analysis of Local Structure  16 Markov Random Fields for Microstructure Simulation 17 Distance Measures for Microstructures  18 Industrial Applications  19 Anomaly Testing  20 Anomalies in Microstructures 21 Denoising Methods with Applications to Microscopy  22 Compressed Sensing for Imaging Applications 23 Dictionary Methods for Compressed Sensing 24 Sparse Sampling in Microscopy

 

 

About the author

Jeffrey P. Simmons, Lawrence F. Drummy, Charles A. Bouman, Marc De Graef

Summary

This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling.

Product details

Authors Jeffrey P. (Air Force Research Laboratory Simmons
Assisted by Charles A Bouman (Editor), Charles A. Bouman (Editor), Marc De Graef (Editor), Lawrence F Drummy (Editor), Lawrence F. Drummy (Editor), Jeffrey P Simmons (Editor), Jeffrey P. Simmons (Editor)
Publisher Taylor & Francis Ltd.
 
Languages English
Product format Paperback / Softback
Released 31.03.2021
 
EAN 9780367780289
ISBN 978-0-367-78028-9
No. of pages 514
Subject Natural sciences, medicine, IT, technology > Technology > Miscellaneous

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