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Informationen zum Autor GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users. Klappentext Complete guidance for becoming an expert user of atomic force microscopy and understanding its research applications Although atomic force microscopy (AFM) is an essential tool in materials and biological research, little systematic training is available for users. Addressing the gap in the field, Atomic Force Microscopy is a comprehensive primer covering knowledge readers need in order to become astute operators of AFM, including basic principles, data analysis, and such applications as imaging, materials property characterization, in-liquid interfacial analysis, tribology (friction/wear), electrostatics, and more. Geared to a wide audience, from students and technicians to research scientists and engineers, this unique guide explains in simple terms the distance-dependent intersurface forces AFM users need to understand when measuring basic surface properties. Moving gradually to more complex areas, it explores such topics as calibration, physical origins of artifacts, and multifrequency methods. Features include: Emphasis on core methods available on most research-grade commercial systems including ancillary modes such as lateral force probes or interleave-based scanning Clarification of essential concepts needed for using dynamic AFM and examining phase images Examples of simple yet useful custom methods to enable shear modulation and setpoint ramping A companion website containing real AFM data files and theoretical constructs for analyzing data Readers will learn to configure and operate instruments and interpret results for successful applications of atomic force microscopy. They will also gain a thorough understanding of a variety of topics for future research and experimentation. Zusammenfassung This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). Inhaltsverzeichnis Preface xiii Acknowledgments xxi 1. Overview of AFM 1 1.1. The Essence of the Technique 1 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction 6 1.3. Modifying a Surface with a Tip 13 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity 16 1.5. Force Curves Plus Mapping in Liquid 21 1.6. Rate, Temperature, and Humidity-Dependent Characterization 24 1.7. Long-Range Force Imaging Modes 28 1.8. Pedagogy of Chapters 30 References 31 2. Distance-Dependent Interactions 33 2.1. General Analogies and Types of Forces 33 2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System 38 2.2.1. Dipole-Dipole Forces 38 2.2.2. Electrostatic Forces 41 2.3. Contact Forces and Mechanical Compliance 44 2.4. Dynamic Probing of Distance-Dependent Forces 51 2.4.1. Importance of Force Gradient 51 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics 56 2.4.3. Effect of Tip-Sample Interaction on Oscillator 60 2.4.4. Energy Dissipation in Tip-Sample Interaction 64 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids 67 2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces 67 2.5.2. Molecular-Structure Forces in Liquids 69 ...
