Measurement and Modeling of Silicon Heterostructure Devices

Informationen zum Autor John D. Cressler Zusammenfassung Focuses on measurement and modeling of high-speed conductor devices. This book provides experience-based tricks of the trade and the subtle nuances of measuring and modeling. It covers topics including compact modeling using integrated CAD tools and design kits, noise mitigation approaches, Germanium RF designs, and, transmission lines. Inhaltsverzeichnis Overview: Measurement and Modeling. Best-Practice AC Measurement Techniques. Industrial Application of TCAD for SiGe Development. Compact Modeling of SiGe HBTs: HICUM.  Compact Modeling of SiGe HBTs: Mextram. CAD Tools and Design Kits. Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs. Transmission Lines on Si. Improved De-Embedding Techniques.

Product details

• Authors: John D. Cressler, John D. (Georgia Institute of Technology Cressler, Cressler John D.
• Publisher: Taylor & Francis Ltd.
• Languages: English
• Product format: Hardback
• Released: 13.12.2007
• EAN: 9781420066920
• ISBN: 978-1-4200-6692-0
• No. of pages: 198
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electrical, Electrical Engineering, environmental science, engineering & technology, Environmental science, engineering and technology, Electronics: circuits and components, Circuits & components