Statistical Analysis of Reliability and Life-Testing Models - Theory and Methods, Second Edition,

Informationen zum Autor Bain, Lee Klappentext Textbook for a methods course or reference for an experimenter who is mainly interested in data analyses rather than in the mathematical development of the procedures. Provides the most useful statistical techniques, not only for the normal distribution, but for other important distributions, such a Zusammenfassung Textbook for a methods course or reference for an experimenter who is mainly interested in data analyses rather than in the mathematical development of the procedures. Provides the most useful statistical techniques, not only for the normal distribution, but for other important distributions, such a Inhaltsverzeichnis PREFACE, 1. PROBABILISTIC MODELS, 2. BASIC STATISTICAL INFERENCE, 3. THE EXPONENTIAL DISTRIBUTION, 4. THE WEIBULL DISTRIBUTION, 5. THE GAMMA DISTRIBUTION, 6. EXTREME-VALUE DISTRIBUTIONS, 7. THE LOGISTIC AND OTHER DISTRIBUTIONS, 8. GOODNESS-OF-FIT TESTS, 9. REPAIRABLE SYSTEMS, APPENDIXES, REFERENCES, INDEX

Product details

• Authors: Lee Bain, Lee (University of Missouri Bain, Lee Englehardt Bain, Max Englehardt
• Publisher: Taylor & Francis Ltd.
• Languages: English
• Product format: Hardback
• Released: 29.03.1991
• EAN: 9780824785062
• ISBN: 978-0-8247-8506-2
• No. of pages: 512
• Series: Statistics: A Series of Textbooks and Monographs
• Subjects: Natural sciences, medicine, IT, technology > Mathematics > General, dictionaries; TECHNOLOGY & ENGINEERING / Quality Control, TECHNOLOGY & ENGINEERING / Industrial Engineering, Reliability engineering, Lee J. Bain;Max Engelhardt