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Zusatztext ? In giving [a] combination of practical and theoretical aspects! the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning electron microscopes or scanning transmission electron microscopes. ? The index is very comprehensive and helps in making the book a valuable reference. Although the text comes from 18 different authors each with their individual style! it is nevertheless well written and clear throughout. The eight unnumbered colour pages at the centre of the book are also a nice feature. Altogether! the book is valuable for experts and those who want to become experts concerned with the design and understanding of charged particle optics as used in electron microscopy. Owing to the rigorous mathematical treatment of particle optical effects! it will also help in the analysis of observed effects such as aberrations and their correction! space charge effects! as well as issues concerning the resolution obtained in microscopy.-Manuel Vogel! Contemporary Physics! Vol. 51! Issue 4! July 2010 Informationen zum Autor Jon Orloff Klappentext Balancing its coverage of theory with a wide range of application areas! this handbook provides a complete guide to understanding! designing! and using high resolution instrumentation. This second edition features new chapters on aberration correction! the transmission electron microscope (TEM)! and applications of gas phase field ionization sources. Zusammenfassung A guide to understanding, designing, and using high resolution probe instrumentation. It offers information for the design and operation of high resolution focused probe instruments. It features chapters on aberration correction and applications of gas phase field ionization sources. Inhaltsverzeichnis Review of ZrO/W Schottky Cathode L. W. Swanson and G. A. SchwindLiquid Metal Ion Sources R. G. Forbes and (the late) G. L. R. MairGas Field Ionization Sources R. G. ForbesMagnetic Lenses for Electron Microscopy K. TsunoElectrostatic Lenses B. LencováAberrations P. W. HawkesSpace Charge and Statistical Coulomb Effects P. Kruit and G. H. JansenResolution M. SatoScanning Electron MicroscopeA. E. Vladár and M. T. PostekScanning Transmission Electron Microscope A. V. Crewe (updated by P. D. Nellist)Focused Ion Beams M. UtlautAberration Correction in Electron Microscopy O. L. Krivanek! N. Dellby and M. F. MurffittAppendix: Computational Resources for Electron Microscopy J. Orloff (with valuable information from P. W. Hawkes and B. Lencová)Index ...
