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A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
List of contents
Dedication; Acknowledgements; Foreword; Preface; 1. The need for ASAT; 2. History of atomic-scale microscopy; 3. Development of ASAT as a concept; 4. Has ASAT been achieved?; 5. How ASAT might be achieved; 6. Instrumentation for ASAT; 7. Practical ASAT; 8. Real space crystallography; 9. Experimental metrics for ASAT; 10. The nexus between ASAT and density functional theory; 11. Implications, applications, and the future of ASAT; Glossary of terms; Index.
About the author
Thomas F. Kelly is a pioneer in the field of atomic-scale research. He was a professor of Materials Science and Engineering at the University of Wisconsin-Madison for 18 years prior to founding Imago Scientific Instruments (later acquired by CAMECA) to commercialize his invention, the local electrode atom probe (LEAP). Currently, Dr Kelly is Founder and CEO of Steam Instruments, Inc., is a Fellow of the Microscopy Society of America, the International Field Emission Society, the Microanalysis Society, and the Korean Society for Microscopy. He was recently elected to the US National Academy of Engineering.Brian P. Gorman is a Professor of Metallurgical and Materials Engineering at the Colorado School of Mines. His group has been developing experimental methods, hardware, and data analysis techniques for correlative electron microscopy and atom probe tomography since 2006.Simon P. Ringer is an engineer and leading researcher in atomic-scale materials design. A Professor in materials engineering in the School of Aerospace, Mechanical and Mechatronic Engineering, and an academic member and former Director of the Australian Centre for Microscopy & Microanalysis at the University of Sydney, he is presently Director of the Core Research Facilities at the University. He is a Fellow of the Institution of Engineers Australia, and a Fellow of the Australian Academy of Technology and Engineering.
