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This book is a collection of articles written by the world's leading scientists in the fields of holography, speckle, optical metrology, non-destructive testing, interferometry, shape measurement, and diffractive optics, to celebrate the 60th anniversary of holography in 2021 and its remarkable impact on numerous areas of science and engineering to the present day. Sixty years after the publication of the seminal article by Leith and Upatnieks, 55 years after the discovery of holographic interferometry by Stetson and Powel, 50 years after the invention of speckle metrology and Gabor's remarkable Nobel lecture in 1971, this unique collection provides a complete overview of this exciting field.
More than 40 peer-reviewed papers offer a wealth of information on the history, 3D displays, modern microscopy, metrology, deep learning, and tools for virtual reality.
Partly previously published open access in the journal "Light - Advanced Manufacturing", Special Edition 2021 and 2022.
List of contents
Part I. Celebrating Holography and its Impact over 60 years.- Chapter 1. The Discovery of Holographic Interferometry, Its Development and Applications.- Chapter 2. The language of holography.- Chapter 3. Contributions of holography to the advancement of interferometric measurements of surface topography.- Chapter 4. Shearography and its applications - a chronological review.- Chapter 5. 55 Years of Holographic Non-Destructive Testing and Experimental Stress Analysis: Is there still Progress to be expected?.- Chapter 6. Reflections about holographic and non-holographic acquisition of surface topography.- Part II. Digital Transition of Holography.- Chapter 7. Digital holography in production: an overview.- Chapter 8. Snap-shot topography measurement via dual-VCSEL and dual wavelength digital holographic interferometry.- Chapter 9. Parallax Limitations in Digital Holography: A Phase Space Approach.- Chapter 10. Resolution enhancement of digital holographic microscopy via synthetic aperture: a review.
About the author
Dr. Wolfgang Osten is a retired full professor at the University of Stuttgart and former director of the Institute for Applied Optics ITO. His research is focused on new concepts for machine vision by combining modern principles of optical metrology, sensor technology and digital image processing. Osten is a Fellow of OSA, SPIE, EOS, SEM, and a senior member of IEEE. He has received the Gabor Award from SPIE, the Kingslake Medal from SPIE, the Vikram Award from SPIE, and the Leith Medal from OSA. He has published several books and more than 300 articles in peer reviewed journals.
Dr. Yuhong Bai is a full professor at CIOMP, Chinese Academy of Sciences. She is head of the Light Publishing Group, director and deputy editor-in-chief of the journals Light: Science & Applications and Light: Advanced Manufacturing. She is a member of the organizing committee of UNESCO's International Year of Light and International Day of Light, and a board member of the Chinese Optical Society. She has co-edited three books and has published more than 70 peer-reviewed journal papers.
