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Zusatztext "Recommended for upper-division undergraduates through professional scientists in chemistry! materials science! physics! and biology." (Choice! Vol. 38! No. 10! June 2001)"My overall impression of this book was positive." (The Alchemist! 4 September! 2001) Informationen zum Autor DAWN BONNELL, PhD, is a professor in the Department of Materials Science at the University of Pennsylvania. Klappentext A practical introduction to basic theory and contemporary applications across a wide range of research disciplinesOver the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies.Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices.This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology.Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields. Zusammenfassung Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science. Inhaltsverzeichnis FUNDAMENTALS OF OPERATION.Introduction (D. Bonnell).Electron Tunneling, Atomic Forces, and Scanning Probe Microscopy (D. Bonnell & B. Huey).Theory of Scanning Tunneling Microscopy (J. Tersoff).Methods of Tunneling Spectroscopy with STM (R. Hamers & D. Padowitz).TIPS AND SURFACES.The Surface Structure of Crystalline Solids (W. Unertle).The Preparation of Tips and Sample Surfaces for Scanning Probe Experiments (G. Rohrer & R. Smith).APPLICATIONS OF SCANNING PROBE MICROSCOPY.Electrostatic and Magnetic Force Microscopy (S. Kalinin & D. Bonnell).BEEM and Characterization of Buried Interfaces (W. Kaiser, et al.).The Scanning Probe Microscopy in Biology (S. Lindsay).Nanomechanics with SPM (N. Burnham & R. Colton).Near Field Scanning Optical Microscopy (D. Higgins & E. Mei).Applications of Electrochemical Probe Microscopy (A. Bard & F. Fan).Appendices....
