Fr. 138.00

Characterization of Condensed Matter - An Introduction to Composition, Microstructure, and Surface Methods

English · Hardback

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Description

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Ein umfassendes Buch, in dem wesentliche Techniken zur Charakterisierung der Struktur und Zusammensetzung kondensierter Materie sowie die jeweiligen Grundlagen, benötigten Instrumente und möglichen Anwendungen dargestellt sind.

List of contents

PART I. Fundamental of Universe, Matter, Condensed Matter and Crystallography
 
Chapter 1. Universe, Matter, Condensed Matter and Materials
Chapter 2. Laser Interferometer Gravitational Wave Observatory
Chapter 3. Fundamentals of Crystallography for Microstructure Characterization of Condensed Matter
 
PART II. Electromagnetic Spectroscopy
 
Chapter 4. Element of X-Ray Diffraction
Chapter 5. X-Ray Fluorescence Spectroscopy (XRF)
Chapter 6. X-Ray Emission Spectroscopy (XES)
Chapter 7. X-Ray Absorption Spectroscopy (XAS): X-Ray Absorption Near Edge Structure (XANES) and Extended X-Ray Absorption Fine Structure (EXAFS)
Chapter 8. X-Ray Raman Scattering (XRS(
Chapter 9. Fourier Transform Infrared Spectroscopy (FTIR)
Chapter 10. Energy Dispersive X-Ray Spectrum of Elements (EDX)
 
PART III. Characterization Methods Based on the Particle (Electron or Electron Beam, Neutron)-Matter Interaction
 
Chapter 11. Scanning Electron Microscope (SEM)
Chapter 12. Transmission Electron Microscope (TEM)
Chapter 13. Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM)
Chapter 14. Environmental Transmission Electron Microscope (ETEM)
Chapter 15. Holography
 
PART IV. Characterization Methods for Hyperfine Structures Related to the Magnetic Properties of Electrons and Nuclei
 
Chapter 16. Nuclear Magnetic Resonance Spectroscopy
Chapter 17. Mössbauer Effect and Mössbauer Spectroscopy
 
PART V. Surface Analysis Method
 
Chapter 18. Atomic Force Microscope (AFM)
Chapter 19. X-Ray Photoelectron Spectroscopy (XPS)
 
PART VI. Some Progress and Perspective
 
Chapter 20. Instrumentation Based on Fundamental Progress in Interaction Electromagnetic Wave and Matter, and Electron-Matter Interaction

About the author










Yujun Song, PhD, is Professor in Physics at University of Science and Technology Beijing, China, and Deputy Director of Center for Modern Physics Technology. He has previously studied and worked in both the United States and Canada. In addition to his extensive research into subjects such as surface and interface-controlled fabrication of functional materials for information technology, new energy and catalysis, and biomedicine, he is the long-time instructor of graduate and undergraduate courses on the characterization of condensed matter. Qingwei Liao, PhD, is Associate Professor at Beijing Information Science & Technology University, China. She has previously held a visiting faculty position at Harvard University and has published extensively on nanomaterials, applied physics, and related subjects. She serves as the main lecturer of courses like modern analytical testing methods for graduate students.

Product details

Authors Qingwei Liao, Yujun Song
Publisher Wiley-VCH
 
Languages English
Product format Hardback
Released 06.09.2023
 
EAN 9783527351091
ISBN 978-3-527-35109-1
No. of pages 368
Dimensions 175 mm x 22 mm x 250 mm
Weight 850 g
Illustrations 19 SW-Abb., 122 Farbabb., 9 Tabellen
Subjects Natural sciences, medicine, IT, technology > Chemistry
Non-fiction book > Nature, technology > Natural science

Chemie, Physik, Werkstoffprüfung, Analytische Chemie, Festkörperphysik, chemistry, Physics, Materialwissenschaften, Solid State Physics, Condensed matter, Materials science, Analytical Chemistry, Materials Characterization, Kondensierte Materie

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