Fr. 146.00

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2022, Montreal, QC, Canada, August 26-27, 2022, Proceedings

English · Paperback / Softback

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2022, held in Montreal, QC, Canada, in August 2022.The 30 papers together with 2 invited talks presented in this volume were carefully reviewed and selected from 50 submissions. The workshops presents papers on topics such as deep learning, processing, computer vision, machine learning and pattern recognition and much more.

Product details

Assisted by Adam Krzyzak (Editor), Nicola Nobile (Editor), Ching Y. Suen (Editor), Andrea Torsello (Editor), Andrea Torsello et al (Editor), Ching Y Suen (Editor)
Publisher Springer, Berlin
 
Languages English
Product format Paperback / Softback
Released 02.01.2023
 
EAN 9783031230271
ISBN 978-3-0-3123027-1
No. of pages 324
Dimensions 155 mm x 18 mm x 235 mm
Illustrations XIII, 324 p. 118 illus., 93 illus. in color.
Series Lecture Notes in Computer Science
Subject Natural sciences, medicine, IT, technology > IT, data processing > IT

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