Advanced Materials Characterization - Basic Principles, Novel Applications, and Future Directions

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

List of contents

1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials

About the author

Ch Sateesh Kumar

Summary

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Product details

• Authors: Ram Krishna, Krishna Ram, Ch Sateesh Kumar, Ch Sateesh (University of Johannesburg Kumar, M Muralidhar Singh, M. Muralidhar Singh
• Publisher: Taylor & Francis Ltd.
• Languages: English
• Product format: Hardback
• Released: 05.05.2023
• EAN: 9781032375106
• ISBN: 978-1-0-3237510-6
• No. of pages: 130
• Series: Advanced Materials Processing and Manufacturing
• Subjects: Natural sciences, medicine, IT, technology > Technology > Chemical engineering; SCIENCE / Chemistry / Analytic, TECHNOLOGY & ENGINEERING / Engineering (General), Spectrum analysis, spectrochemistry, mass spectrometry, Instruments & instrumentation engineering, Instruments and instrumentation