Fr. 144.00

Transmission Electron Microscopy 4 Vol Set: A Textbook for Materials Science

English · Paperback / Softback

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Description

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This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

List of contents

Basics: 1. The Transmission Electron Microscope. 2. Scattering and Diffraction. 3. Elastic Scattering. 4. Inelastic Scattering and Beam Damage. 5. Electron Sources. 6. Lenses, Apertures, and Resolution 7. How to 'See' Electrons. 8. Pumps and Holders. 9. The Instrument 10. Specimen Preparation. Diffraction: 11. Diffraction Patterns. 12. Thinking in Reciprocal Space 13. Diffracted Beams. 14. Bloch Waves. 15. Dispersion Surfaces. 16. Diffraction from Crystals. 17. Diffraction from Small Volumes. 18. Indexing Diffraction Patterns. 19. Kikuchi Diffraction. 20. Obtaining CBED Patterns. 21. Using Covergent-Beam Technologies. Imaging: 22. Imaging in the TEM. 23. Thickness and Bending Effects. 24. Planar Defects. 25. Strain Fields. 26. WeakBeam Dark-Field Microscopy. 27. Phase-Contrast Images. 28. High-Resolution TEM. 29. Image Simulation. 30. Quantifying and Processing HRTEM Images. 31. Other Imaging Techniques. Spectrometry: 32. Xray Spectrometry. 33. The XEDS-TEM Interface. 34. Qualitative Xray Analysis. 35. Quantitative Xray Microanalysis. 36. Spatial Resolution and Minimum Detectability. 37. Electron EnergyLoss Spectrometers. 38. The EnergyLoss Spectrum. 39. Microanalysis with Ionization-Loss Electrons. 40. Everything Else in the Spectrum. Index.

Product details

Authors C. Barry Carter, David B. Williams
Publisher Springer Verlag Gmbh
 
Languages English
Product format Paperback / Softback
Released 01.01.1996
 
EAN 9780306453243
ISBN 978-0-306-45324-3
No. of pages 703
Dimensions 215 mm x 282 mm x 35 mm
Weight 1964 g
Subject Natural sciences, medicine, IT, technology > Technology > Mechanical engineering, production engineering

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