Fr. 143.00

Mosfet Theory and Design

English · Paperback / Softback

New edition in preparation, currently unavailable

Description

Read more

Klappentext MOSFET Theory and Design presents clearly and in depth the theory and design of the MOSFET device! catering to its dominant position in today's microelectronics technology. This slim volume carefully builds examples from a simple level to more complex! real-life cases. The text includes a detailed bibliography and numerous problems sets - analytic! computer! and design - as well as original analyses! in-text exercises! and chapter summaries and check lists.It is appropriate for a one-semester course for junior! senior! or graduate students in engineering. A solutions manual is available free to adopters of the text. Zusammenfassung This volume presents in-depth the theory and design of the MOSFET device, catering to its dominant position in today's microelectronics technology. It builds examples from a simple level to more complex real-life cases and includes numerous problem sets and original analyses.

List of contents










  • Chapter 1 Basic MOSFET Theory

  • 1-1: Field-Effect Transistors

  • 1-2: Mosfet Definitions

  • 1-3: Rudimentary Analysis

  • 1-4: Current-Voltage Equations

  • 1-5: Universal Transfer Characteristics

  • 1-6: Transconductance

  • 1-7: Inverter Options

  • Chapter 2 MOS-Capacitor Phenomena

  • 2-1: Oxide-Silicon Boundary Conditions

  • 2-2: Approximate Field and Potentials Profiles

  • 2-3: Accurate Band Diagram

  • 2-4: Barrier-Height Difference

  • 2-5: Interfacial Charge

  • 2-6: Oxide Charge

  • 2-7: Calculating Threshold Voltage

  • Chapter 3 MOS-Capacitor Modeling

  • 3-1: Exact-Analytic Surface Modeling

  • 3-2: Comparing MOS and Junction Capacitances

  • 3-3: Small-Signal Equivalent Circuits

  • 3-4: Ideal Voltage-Dependent Capacitance

  • 3-5: Real Voltage-Dependent Capacitance

  • 3-6: Physics of MOS-Capacitance Crossover

  • 3-7: Analysis of MOS-Capacitance Crossover

  • Chapter 4 Improved MOSFET Theory

  • 4-1: Channel-Junction Interactions

  • 4-2: Ionic Charge Model

  • 4-3: Body Effect

  • 4-4: Advanced Long-Channel Models

  • Chapter 5 SPICE Models

  • 5-1: Level-2 Parameters

  • 5-2: Level-2 Model

  • 5-3: Small-Signal Applications of Model

  • 5-4: Large-Signal Applications of Model

  • Chapter 6 MOSFET-BJT Performance Comparisons

  • 6-1: Simple-Theory Transconductance Comparison

  • 6-2: Subthreshold Transconductance Theory

  • 6-3: Calculating Maximum MOSFET gm/out

  • 6-4: Transconductance versus Input Voltage

  • 6-5: Physics of Subthreshold Transconductance

  • Chapter 7 MOSFET Design for Today's ICs

  • 7-1: Survey of Recent Models [e.g., BSIM 1-3]

  • 7-2: Solving Key Problems [e.g., subthreshold, hot-electron, short-channel effects]

  • 7-3: Additional Circuit-Design Issues [e.g., noise analysis, temperature effects, characteristic matching]

  • 7-4: Related Devices [e.g., MODFET, JFET]

  • 7-5: Future Trends in Device Simulation

  • Appendixes

  • Tables

  • References

  • Topics for Review

  • Analytic Problems

  • Computer Problems

  • Design Problems

  • Symbol Index

  • Subject Index



Product details

Authors B. L. Grung, Grung B. L., Jr. R. M. Warner, R. M. Warner, R.M. Warner, R.m. Grung Warner
Publisher Oxford University Press
 
Languages English
Product format Paperback / Softback
Released 01.12.1998
 
EAN 9780195116427
ISBN 978-0-19-511642-7
No. of pages 270
Series Oxford University Press
Subjects Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

Electronic devices and materials, Semi-conductors & super-conductors

Customer reviews

No reviews have been written for this item yet. Write the first review and be helpful to other users when they decide on a purchase.

Write a review

Thumbs up or thumbs down? Write your own review.

For messages to CeDe.ch please use the contact form.

The input fields marked * are obligatory

By submitting this form you agree to our data privacy statement.