Microprobe Characterization of Optoelectronic Materials

About the author

Juan Jiménez is a Professor at the University of Valladolid, Spain, working in the field of microscopic characterization of semiconductors, using electron (Cathodoluminescence) and optical (photoluminescence, Raman scattering and photocurrent) beams. He has studied the local properties and uniformity of GaAs, SiC, InP and other semiconductors. He received his degree in Physics from the University of Valladolid in 1975 and his PhD from Valladolid in 1979. He undertook postdoctoral work at the University of Montpellier, France from 1978-1981 and received a PhD from Montpellier University in 1981.

Summary

Discusses microprobe technique and its usefulness as diagnostic technique for device degradation. This book considers various types of probes (electrons, photons and tips) and different microscopes (optical, electron microscopy and tunneling). It is suitable for researchers, crystal growers and optoelectronic device makers.

Product details

• Authors: Juan Jimenez, Jimenez Juan
• Publisher: Taylor and Francis
• Languages: English
• Product format: Hardback
• Released: 15.11.2002
• EAN: 9781560329411
• ISBN: 978-1-56032-941-1
• No. of pages: 730
• Weight: 1065 g
• Illustrations: farbige Illustrationen
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Electricity, magnetism, optics; SCIENCE / Physics / Electricity, SCIENCE / Physics / Magnetism, SCIENCE / Physics / Electromagnetism, TECHNOLOGY & ENGINEERING / Fiber Optics, Materials science, Electricity, electromagnetism & magnetism, TECHNOLOGY & ENGINEERING / Materials Science / General, Electricity, electromagnetism and magnetism, Electronic devices and materials, Fibre optics, Semi-conductors & super-conductors