Memory, Microprocessor, and ASIC

About the author

Wai-Kai Chen

Summary

Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs).

Product details

• Assisted by: Wai-Kai Chen (Editor), Chen Wai-Kai (Editor)
• Publisher: Taylor and Francis
• Languages: English
• Product format: Hardback
• Released: 26.03.2003
• EAN: 9780849317378
• ISBN: 978-0-8493-1737-8
• No. of pages: 384
• Weight: 1830 g
• Illustrations: schwarz-weiss Illustrationen, Tabellen, schwarz-weiss
• Series: Principles and Applications in Engineering
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electrical, Energy, power generation, distribution and storage, Electronics: circuits and components, Circuits & components, Power generation & distribution