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This reference is devoted to a new drift-spectrometry method using surface ionization of nitrogen-, phosphorus-, arsenic- and sulfur-containing organics that improves analytical capabilities. The authors demonstrate the methods versatility in identifying multiple parameters for electronic materials and devices.
List of contents
Traditional methods of drift spectrometry
Theoretical models of surface ionization of organic compounds
Elements of the theory of surface-ionization drift spectrometry
Structures and technologies of surface-ionization
drift spectrometers
Properties of materials for thermoemitters of ions of organic compounds
Research of active centres on the surface of oxidized molybdemum alloys
Research of active centres on the surface of alkali metal oxide bronzes
Surface ionization parameters of organic compounds
Mass spectrometry of the composition of ion current from the surface of ion thermoemitters
Determination of physical and chemical parameters of organic compounds in the ion source of surface-ionization drift spectrometer
Determination of the physical and chemical parameters of organic compounds in the drift camera of a surface-ionization drift spectrometer
Development of laboratory installations of surface-ionization drift spectrometers
Conclusion, References, Index
About the author
Vladimir I. Kapustin, Professor, Russian Technological University, Moscow, RU
Alexey P. Korzhavyi, Professor, Bauman Moscow State Technical University, Moscow, RU
Summary
Surface-Ionization Drift-Spectrometry is devoted to a new drift-spectrometry method using surface ionization of nitrogen-, phosphorus-, arsenic- and sulfur-containing organics. New theoretical approaches are described that successfully combine a surface-ionization source and a drift spectrometer of coaxial type to obtain multi-parameter detection of organic molecules in a single instrument.
This reference examines various versions of the device and the model set of nitrogen, phosphorus, arsenic and sulfur-containing organics result in successful identification of three to seven independent parameters. The authors demonstrate the methods versatility in identifying multiple parameters for electronic materials and devices.
Additional features include:
- Demonstrates a new approach to Time-of-Flight Ion Mobility Spectrometry (TFIMS).
- Explores alternative methods for High-field Asymmetric Waveform Ion Mobility Spectrometry (FAIMS).
- Offers readers greater multi-parameter identification, selectivity, and resistance to fluctuations in humidity.
