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The text written below describes an experimental process, which can serve as a manual for professionals or even industrialists who would like to reproduce the Kelvin or 4-point method under similar characteristics to those described below, in order to obtain electrical properties in conductive and semiconductor materials. This text not only shows the equipment used, but also intrinsically shows the importance of having equipment and devices of easy and fast application to obtain in a reliable and concrete way micro and even nanometric values of these properties.At the same time, the development and application of the method using the measuring source, primordial device that served as control equipment of the applied physical magnitude (electric current), requires a correct use of it. This text also gives a brief explanation of the use of the source and some of its characteristics.
About the author
Emmanuel Espinosa de la BorbollaEngenheiro de Energia, Universidade Autônoma Metropolitana do México.Enrique Barrera CalvaProfessor/Pesquisador. Universidade Autônoma Metropolitana. Cidade do MéxicoCarlos Álvarez MacíasProfessor/Pesquisador. Instituto Tecnológico de La Laguna, Torreón, Coahuila.
