Fr. 151.00

2001 6th International Workshop on Statistical Methodology: Iwsm: June 10, 2001/Kyoto

English · Hardback

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Description

The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

Product details

Publisher	Wiley

Languages	English
Product format	Hardback
Released	01.01.2001

EAN	9780780366886
ISBN	978-0-7803-6688-6
No. of pages	67
Series	IEEE Conference Proceedings
Subject	Natural sciences, medicine, IT, technology > Technology > General, dictionaries

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