Fr. 138.00

Ieee

European Test Workshop (Etw 2000) [Postproceedings]

English · Paperback / Softback

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Description

The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

Product details

Assisted by	Ieee (Editor)
Publisher	Wiley

Languages	English
Product format	Paperback / Softback
Released	01.11.2000

EAN	9780769507019
ISBN	978-0-7695-0701-9
No. of pages	181
Subject	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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