Fr. 69.00

Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings

English · Paperback / Softback

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Description

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.
The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

List of contents

Classification and data processing.- Deep learning.- Graph-theoretic methods.- Multimedia analysis and understanding.

Product details

Assisted by Battista Biggio (Editor), Marcello Pelillo (Editor), Marcello Pelillo et al (Editor), Antonio Robles-Kelly (Editor), Luc Rossi (Editor), Luca Rossi (Editor), Andrea Torsello (Editor)
Publisher Springer, Berlin
 
Languages English
Product format Paperback / Softback
Released 21.06.2021
 
EAN 9783030739720
ISBN 978-3-0-3073972-0
No. of pages 378
Dimensions 155 mm x 20 mm x 235 mm
Illustrations XII, 378 p. 103 illus., 84 illus. in color.
Series Lecture Notes in Computer Science
Image Processing, Computer Vision, Pattern Recognition, and Graphics
Subject Natural sciences, medicine, IT, technology > IT, data processing > IT

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