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This paper presents the model designed for the analysis of images containing diffraction patterns, as well as the software developed to make measurements of angles and distances between different characteristic points (signals) included in the patterns under study by the researchers of the Center for Research in Advanced Materials (CIMAV). The main reason for developing this system is that researchers must perform the process of analysis and indexing of diffraction patterns manually, a task that becomes tedious and prone to human error. That is why the tool was designed to automate and assist in the indexing of patterns in images, facilitating the process of signal detection and thus achieving a more accurate measurement between the elements of the diffraction pattern analyzed.
About the author
Tania Campos obtuvo la Maestría Sistemas Computacionales en el área de Inteligencia Artificial en el TecNM campus Chihuahua II en 2016. Es coautora del artículo Method for Signals Detection in Single Crystal Diffraction Patterns through a Diffraction Pattern Indexing Software publicado en el Journal of Mechanics Engineering and Automation en 2015.
