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This practical guide shows how to efficiently use the method for a variety of applications. Numerous examples as well as ideas for problem solving and troubleshooting are presented. The new edition is updated with the latest developments in methods and applications.
List of contents
OVERVIEW
Analytic features of the ICP OES
ICP OES - definitions
Distribution of the ICP emission spectrometers
Complimentary techniques for elemental analysis
MIP and LIPS
Symbols, abbreviations and acronyms used
PLASMA
The analytically used plasma
Argon
Added gases (e.g. Oxygen or Nitrogen)
Materials used for ICP torches
Orientation of the plasma (e.g. vertical vs. horizontal)
Excitation to emit electromagnetic radiation
High-frequency generator
Sample introduction system
Nebulizers
OPTICS AND DETECTOR OF THE SPECTROMETER
Principles of optics
Detector
Emission spectrometer mounts
Scanning Array Spectrometers
Simultaneous Array Spectrometers
METHOD DEVELOPMENT
Wavelength selection
Reference to NIST-Atlas
Processing and correction techniques
Non-spectral interferences
Optimization
Validation
Procedure to check linearity
ROUTINE ANALYSIS
Preliminary steps
Calibration
Quality control
Software and data management
TROUBLE SHOOTING
APPLICATIONS
General Notes
Notes on specific elements
Selected applications
INSTRUMENT PURCHASING AND LABORATORY PREPARATION
Which technique in atomic spectrometry is preferred?
Which ICP emission spectrometer is best for the application?
Preparation of the laboratory
LITERATURE
INDEX
About the author
Joachim Nölte studied and completed his PhD degree in environmental analysis at the University of Hamburg, Germany. His work has focussed on ICP OES since 1981 and he has worked at Perkin Elmer on method development. He has extensive experience in teaching the method through courses and presentations. In 2000 he founded a consulting agency called AnalytikSupport.
Summary
This practical guide shows how to efficiently use the method for a variety of applications. Numerous examples as well as ideas for problem solving and troubleshooting are presented. The new edition is updated with the latest developments in methods and applications.
