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List of contents
Statistical Preliminaries. The Gaussian Process. Processes Derived from Gaussian Noise. Scattering by a Collection of Discrete Objects: The Random Walk Model. Scattering by Continuous Media: Phase Screen Models. Scattering by Smoothly Varying Phase Screens. Scattering by Fractal Phase Screens. Other Phase Screen Models. Propagation through Inhomogeneous Extended Media. Multiple scattering: Fluctuations in Double Passage and Multipath Scattering Geometries. Vector Scattering: Polarisation Fluctuations. K-Distributed Noise. Measurement and Detection. Numerical Techniques.
About the author
Jakeman, E.; Ridley, K. D.
Summary
Fluctuations in scattered waves limit the performance of imaging and remote sensing systems that operate on all wavelengths of the electromagnetic spectrum. To better understand these fluctuations, Modeling Fluctuations in Scattered Waves provides a practical guide to the phenomenology, mathematics, and simulation of non-Gaussian noise models and discusses how they can be used to characterize the statistics of scattered waves.
Through their discussion of mathematical models, the authors demonstrate the development of new sensing techniques as well as offer intelligent choices that can be made for system analysis. Using experimental results and numerical simulation, the book illustrates the properties and applications of these models. The first two chapters introduce statistical tools and the properties of Gaussian noise, including results on phase statistics. The following chapters describe Gaussian processes and the random walk model, address multiple scattering effects and propagation through an extended medium, and explore scattering vector waves and polarization fluctuations. Finally, the authors examine the generation of random processes and the simulation of wave propagation.
Although scattered wave fluctuations are sources of information, they can hinder the performance of imaging and remote sensing systems. By providing experimental data and numerical models, this volume aids you in evaluating and improving upon the performance of your own systems.
