Atomic Force Microscopy - Fundamental Concepts and Laboratory Investigations

List of contents

1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes of AFM 9. Image Processing

About the author

Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.

Summary

This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

Product details

• Authors: Wesley C. Sanders, Wesley C. (Salt Lake Community College Sanders
• Publisher: Taylor & Francis Ltd.
• Languages: English
• Product format: Hardback
• Released: 31.10.2019
• EAN: 9780367371234
• ISBN: 978-0-367-37123-4
• No. of pages: 139
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Electricity, magnetism, optics; Microscopy, TECHNOLOGY & ENGINEERING / Electronics / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electrical, TECHNOLOGY & ENGINEERING / Sensors, Optical physics, Scientific equipment, experiments and techniques, Instruments & instrumentation engineering, Electronics: circuits and components, Circuits & components, Instruments and instrumentation