Fr. 59.40

Materials Reliability in Microelectronics III: Volume 309

English · Hardback

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Description

Product details

Authors Kenneth P. Rodbell
Assisted by William F. Filter (Editor), Harold J. Frost (Editor), Harold J. (Dartmouth College Frost (Editor), Paul S. (University of Texas Ho (Editor), Kenneth P. Rodbell (Editor), Kenneth P. (IBM T J Watson Research Center Rodbell (Editor)
Publisher CAMBRIDGE
 
Languages English
Product format Hardback
Released 31.12.2019
 
EAN 9781558992054
ISBN 978-1-55899-205-4
No. of pages 516
Dimensions 160 mm x 234 mm x 33 mm
Weight 885 g
Series MRS Proceedings
Subject Natural sciences, medicine, IT, technology > Technology > General, dictionaries

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