Fr. 59.90

Materials Reliability in Microelectronics II: Volume 265

English · Hardback

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Description

Product details

Authors C. V. Thompson
Assisted by J. R. Lloyd (Editor), J. R. (DIGITAL Equipment Corporation Lloyd (Editor), C. V. Thompson (Editor), C. V. (Massachusetts Institute of Technology) Thompson (Editor)
Publisher CAMBRIDGE
 
Languages English
Product format Hardback
Released 31.12.2019
 
EAN 9781558991606
ISBN 978-1-55899-160-6
No. of pages 346
Dimensions 160 mm x 231 mm x 23 mm
Weight 635 g
Series MRS Proceedings
Subjects Natural sciences, medicine, IT, technology > Technology > General, dictionaries

Elektronik, Nachrichtentechnik

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