Radiation Effects & Soft Errors ...(V34)

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Product details

• Authors: Schrimpf Ronald D, R D Schrimpf & D M Fleetwood, Schrimpf Ronald D
• Assisted by: Daniel M Fleetwood (Editor), Daniel M. Fleetwood (Editor), Ronald D Schrimpf (Editor), Ronald D. Schrimpf (Editor)
• Publisher: World Scientific
• Languages: English
• Product format: Hardback
• Released: 31.12.2019
• EAN: 9789812389404
• ISBN: 978-981-238-940-4
• No. of pages: 348
• Dimensions: 157 mm x 235 mm x 23 mm
• Weight: 655 g
• Series: Selected Topics in Electronics and Systems; Selected Topics in Electronics
• Subject: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering