Fr. 59.90

Daniel Müller

RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range - Dissertationsschrift

English · Paperback / Softback

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Description

Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

Product details

Authors	Daniel Müller
Publisher	KIT Scientific Publishing

Languages	English
Product format	Paperback / Softback
Released	26.11.2018

EAN	9783731508229
ISBN	978-3-7315-0822-9
No. of pages	214
Dimensions	148 mm x 210 mm x 12 mm
Weight	405 g
Illustrations	graph. Darst.
Series	Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik Karlsruher Forschungsberichte aus dem Institut für Hochfrequenztechnik und Elektronik
Subject	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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