Fr. 181.20

David J Dumin, David J. Dumin

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability

English · Hardback

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Description

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field

Product details

Assisted by	David J Dumin (Editor), David J. Dumin (Editor)
Publisher	World Scientific Publishing Company

Languages	English
Product format	Hardback
Released	28.01.2002

EAN	9789810248420
ISBN	978-981-02-4842-0
No. of pages	280
Dimensions	170 mm x 256 mm x 20 mm
Weight	626 g
Series	Selected Topics in Electronics Selected Topics in Electronics and Systems Selected Topics in Electronics
Subject	Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics

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