Fr. 194.00

Ieee, International Conference on Simulation o, International Conference on Simulation of Semiconductor Processes and Devices (2003 Bost

2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices - Sispad 2003: Boston, Massachusetts, USA, 3-5 September, 2003

English · Paperback / Softback

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Description

Taken from the proceedings of the 2003 International Conference of the Simulation of Semiconductor Processes and Devices (SISPAD 2003), this volume looks at electron devices.

Product details

Authors	Ieee, International Conference on Simulation o, International Conference on Simulation of Semiconductor Processes and Devices (2003 Bost
Publisher	IEEE Computer Society Press

Languages	English
Product format	Paperback / Softback
Released	01.09.2003

EAN	9780780378261
ISBN	978-0-7803-7826-1
No. of pages	329
Dimensions	216 mm x 279 mm x 18 mm
Subject	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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