Fr. 224.00

Ieee

VLSI Test Symposium (Vts 2004)

English · Hardback

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Description

The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.

Product details

Authors	Ieee
Publisher	Wiley

Languages	English
Product format	Hardback
Released	01.01.2004

EAN	9780769521343
ISBN	978-0-7695-2134-3
No. of pages	550
Subject	Natural sciences, medicine, IT, technology > Technology > Mechanical engineering, production engineering

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