Fr. 211.60

RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

English · Hardback

Shipping usually within 3 to 5 weeks (title will be specially ordered)

Description

Product details

Authors Jianjun Gao
Publisher Institution of Engineering & Technology
 
Languages English
Product format Hardback
Released 01.06.2010
 
EAN 9781891121890
ISBN 978-1-891121-89-0
No. of pages 350
Dimensions 157 mm x 234 mm x 23 mm
Weight 590 g
Series Electromagnetics and Radar
Electromagnetic Waves
Subject Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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