Fr. 202.40

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits - The System on Chip Approach

English · Paperback / Softback

Shipping usually within 3 to 5 weeks (title will be specially ordered)

Description

Product details

Assisted by Yichuang Sun (Editor)
Publisher Institution of Engineering & Technology
 
Languages English
Product format Paperback / Softback
Released 30.05.2008
 
EAN 9780863417450
ISBN 978-0-86341-745-0
No. of pages 416
Dimensions 156 mm x 234 mm x 22 mm
Weight 623 g
Series Circuits, Devices and Systems
Materials, Circuits and Device
Circuits, Devices and Systems
Subject Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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