Testing at the Speed of Light - The State of U.S. Electronic Parts Space Radiation Testing Infrastructure

Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling.
Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Product details

• Authors: Committee on Space Radiation Effects Testing Infrastructure for the U S Space Program, Division on Engineering and Physical Sci, Division on Engineering and Physical Sciences, National Academies Of Sciences Engineeri, National Academies of Sciences Engineering and Medicine, National Materials and Manufacturing Boa, National Materials and Manufacturing Board
• Publisher: National Academies Press
• Languages: English
• Product format: Paperback / Softback
• Released: 31.07.2018
• EAN: 9780309470797
• ISBN: 978-0-309-47079-7
• No. of pages: 88
• Dimensions: 216 mm x 277 mm x 8 mm
• Weight: 227 g
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics; Physik, Science, SCIENCE / Physics / General, TECHNOLOGY & ENGINEERING / Materials Science