Fr. 135.00

Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements

English · Hardback

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Description

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This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

List of contents

Chapter 1. Introduction.- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion.- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency.- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing.- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration.- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test.- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test.- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio.- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise.- Chapter 10.Summary.

About the author

Yuming Zhuang is a Senior Product and Design Engineer in the Corporate R&D division, at Qualcomm Inc, in San Diego, California.

Degang Chen is the Jerry Junkins Chair Professor in the Department of Electrical and Computer Engineering, at Iowa State University, in Ames, Iowa.

Summary

This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.

Product details

Authors Degang Chen, Yumin Zhuang, Yuming Zhuang
Publisher Springer, Berlin
 
Languages English
Product format Hardback
Released 01.01.2018
 
EAN 9783319777177
ISBN 978-3-31-977717-7
No. of pages 170
Dimensions 160 mm x 15 mm x 245 mm
Weight 391 g
Illustrations XIV, 170 p. 89 illus., 88 illus. in color.
Subjects Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

B, engineering, Circuits and Systems, Electronic Circuits and Devices, Electronic devices & materials, Electronics, Microelectronics, Electronics and Microelectronics, Instrumentation, Electronics engineering, Electronic circuits, Electronic Circuits and Systems, Electronics: circuits & components

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