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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
List of contents
- 1: Introduction
- 2: Instrumental Aspects of AFM
- 3: AFM Modes
- 4: Measuring AFM Images
- 5: Image Processing in AFM
- 6: Image Artifacts in AFM
- 7: Applications of AFM
- Appendix 1: AFM Standards and Calibration Specimens
- Appendix 2: AFM Software
About the author
Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities across Europe. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.
Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.
Summary
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Additional text
I recommend this book to any reader who wants to enter the world of force microscopy. This book is easy to read, entertaining, with a practical approach.
