Introduction to Scanning Probe Microscopy

This book covers the wide range of methods, which have become standard tools in every biology, material science, surface science, and optics laboratory: those that measure tip-sample interactions with forces and those that measure tip-sample interactions with currents. It emphasizes the fundamentals that may be applied to basic through advanced applications, including such topics as van der Waals forces between macroscopic objects, strain-stress analysis, continuum deformation theory, friction theory at the microscopic level, control theory, and an introduction to surface states and surface reconstruction.

Summary

This book covers the wide range of methods, which have become standard tools in every biology, material science, surface science, and optics laboratory: those that measure tip-sample interactions with forces and those that measure tip-sample interactions with currents. It emphasizes the fundamentals that may be applied to basic through advanced applications, including such topics as van der Waals forces between macroscopic objects, strain-stress analysis, continuum deformation theory, friction theory at the microscopic level, control theory, and an introduction to surface states and surface reconstruction.

Product details

• Authors: Biagioni, Paolo Biagioni, Paolo (Politecnico DI Milano Biagioni, Paolo Labardi Biagioni, Massimiliano Labardi, Massimiliano (Istituto per i Processi Chimico-Fisici Labardi
• Publisher: Taylor & Francis Ltd.
• Languages: English
• Product format: Hardback
• Release: 31.12.2019, delayed
• EAN: 9781466588011
• ISBN: 978-1-4665-8801-1
• No. of pages: 384
• Subjects: Natural sciences, medicine, IT, technology > Natural sciences (general); Natural sciences, medicine, IT, technology > Technology > General, dictionaries; SCIENCE / Physics / General, Microscopy, SCIENCE / Physics / Condensed Matter, Materials science, Scientific equipment, experiments and techniques, TECHNOLOGY & ENGINEERING / Materials Science / General