Fr. 190.90

FUNDAMENTAL & APPLIED PROBLEMS OF TERAHERTZ DEVICES & TECH

English · Hardback

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Description

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Terahertz (THz) electromagnetic waves, phenomena in the THz range and related technological issues have been explosively investigated during the recent two decades. However, its potential as a disruptive technology to commercial applications has yet to make any impression.
The Russia-Japan-USA-Europe Symposium on Fundamental and Applied Problems of Terahertz Devices and Technologies (RJUSE-TeraTech 2016), held at Katahira Campus of Tohoku University, Sendai, Japan on October 31 - November 4, 2016, aims to bring together researchers from Russia, Japan, USA and Europe, who are working on the broad range of related problems in the terahertz devices, technologies and applications, to discuss on state-of-the-art results and future directions and collaborations in the development of THz.
This is the fifth in the series of preceding successful symposiums in Terahertz Devices and Technologies. It contains 14 selected extended papers presented at the RJUSE-TeraTech 2016 symposium, addressing the variety of topics, in particular, THz detectors based on double heterojunction bipolar transistors (DHBT) and field effect transistors (FET) utilizing resonant plasma effects, quantum cascade (QCL) and HgCdTe quantum-well heterostructures, and graphene-based THz devices.

Product details

Authors Akira Satou & Taiichi Otsu Maxim Ryzhii
Assisted by Taiichi Otsuji (Editor), Maxim V Ryzhii (Editor), Maxim V. Ryzhii (Editor), Akira Satou (Editor)
Publisher World Scientific
 
Languages English
Product format Hardback
Released 06.03.2017
 
EAN 9789813223271
ISBN 978-981-3223-27-1
No. of pages 138
Dimensions 175 mm x 250 mm x 12 mm
Weight 430 g
Series Selected Topics in Electronics
Selected Topics in Electronics
Subject Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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