CMOS Test and Evaluation - A Physical Perspective

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

List of contents

Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.

About the author

Manjul Bhushan is a technical consultant in New York.
Mark Ketchen is a technical consultant in Massachusetts.

Summary

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Product details

• Authors: Manju Bhushan, Manjul Bhushan, Mark B Ketchen, Mark B. Ketchen
• Publisher: Springer, Berlin
• Languages: English
• Product format: Paperback / Softback
• Released: 01.01.2016
• EAN: 9781493947027
• ISBN: 978-1-4939-4702-7
• No. of pages: 424
• Dimensions: 156 mm x 25 mm x 235 mm
• Weight: 667 g
• Illustrations: XIII, 424 p. 338 illus.
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; B, engineering, quality control, Circuits and Systems, reliability, Electronic devices & materials, Electronics, Microelectronics, Electronics and Microelectronics, Instrumentation, Semiconductors, Industrial safety, Quality Control, Reliability, Safety and Risk, Reliability engineering, Electronic circuits, Electronic Circuits and Systems, Electronics: circuits & components, Security Science and Technology