Fr. 262.00

Local Electrode Atom Probe Tomography - A User's Guide

English · Paperback / Softback

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Description

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This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP ® ) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

List of contents

Preface.- Acknowledgements.- Foreword.- Abbreviations.- Chapter 1. History of APT and LEAP.- Chapter 2. Specimen Preparation.- Chapter 3. Design & Instrumentation.- Chapter 4. Data Collection.- Chapter 5. Data Processing and Reconstruction.- Chapter 6. Selected Analysis Topics.- Chapter 7. Applications of the Local Electrode Atom Probe.- Appendix A. Data File Formats.- Appendix B. Field Evaporation.- Appendix C. Reconstruction Geometry.- Appendix D. Mass Spectral Performance.- Appendix E. Additional Considerations for LEAP Operation.- Glossary.- Index.

Summary

Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis.

Product details

Authors Brian P. Geiser, Thomas F Kelly, Thomas F. Kelly, David Larson, David J Larson, David J. Larson, Ty Prosa, Ty J Prosa, Ty J. Prosa, Robert M et al Ulfig, Robert M. Ulfig
Assisted by Professor Sir Colin J. Humphreys (Foreword)
Publisher Springer, Berlin
 
Languages English
Product format Paperback / Softback
Released 01.01.2016
 
EAN 9781493952434
ISBN 978-1-4939-5243-4
No. of pages 318
Dimensions 162 mm x 235 mm x 13 mm
Weight 572 g
Illustrations XVII, 318 p. 164 illus., 54 illus. in color.
Subjects Natural sciences, medicine, IT, technology > Technology > Mechanical engineering, production engineering

Nanotechnologie, B, Microscopy, Nanowissenschaften, Spektroskopie, Spektrochemie, Massenspektrometrie, Chemistry and Materials Science, spectroscopy, Spectroscopy and Microscopy, Nanotechnology, Characterization and Analytical Technique, Materials science, Characterization and Evaluation of Materials, Nanoscale Science and Technology, Nanostructures, Nanoscale science, Nanochemistry, Nanophysics, Nanoscience, Spectrum analysis, spectrochemistry, mass spectrometry, Scientific equipment, experiments & techniques, Spectral Analysis, LEAP tomography book, LEAP tomography, LEAP semiconductor materials, Mass spectral performance, Tomography tips book, Tomography specimen preparation, Solute analysis, Local electrode atom probe tomography how-to, Reconstruction geometry, Spatial distribution maps, LEAP, catalytic materials, Local electrode atom probe, Local electrode atom probe tomograpy, LEAP organic and biological materials, LEAP, metals, LEAP, history of, Tomography how-to book

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