Fr. 132.00

Focused Ion Beam Instrumentation - Techniques and Applications

English · Hardback

Will be released 28.02.2017

Description

Product details

Authors Alexander Buxbaum, Dudley Finch, Dudley Buxbaum Finch
Publisher Wiley, John and Sons Ltd
 
Languages English
Product format Hardback
Release 28.02.2017, delayed
 
EAN 9781119953258
ISBN 978-1-119-95325-8
No. of pages 256
Series RMS - Royal Microscopical Society
RMS - Royal Microscopical Soci
Subject Natural sciences, medicine, IT, technology > Chemistry

Customer reviews

No reviews have been written for this item yet. Write the first review and be helpful to other users when they decide on a purchase.

Write a review

Thumbs up or thumbs down? Write your own review.

For messages to CeDe.ch please use the contact form.

The input fields marked * are obligatory

By submitting this form you agree to our data privacy statement.