Fr. 156.00

Michael D. Meehan, John Purviance

Yield and Reliability in Microwave Circuit and System Design

English · Hardback

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Description

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Product details

Authors	Michael D. Meehan, John Purviance
Publisher	Artech House Publishers

Languages	English
Product format	Hardback
Released	01.12.1993

EAN	9780890065273
ISBN	978-0-89006-527-3
No. of pages	300
Dimensions	159 mm x 237 mm x 21 mm
Weight	585 g
Series	Artech House Microwave Library Artech House Microwave Library
Subject	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering

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